Funded by NSF DMR 0847552.
Code that height-height correlates an atomic force microscopy (AFM) image for quantitative surface analysis. The height-height correlation function (HHCF) allows a user to easily determine the rms surface roughness, the local roughness (Hurst exponent), and the correlation length. An application to phthalocyanine thin films is published here: Thomas Gredig, Evan A. Silverstein, Matthew P. Byrne, Height-Height Correlation Function to Determine Grain Size in Iron Phthalocyanine Thin Films, J. Phys.: Conf. Ser., 417, 012069 (2013).
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